Transient DOS while parsing the EPTM test control message to get the test pattern.
Metrics
Affected Vendors & Products
References
History
Thu, 25 Sep 2025 08:30:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| First Time appeared |
Qualcomm
Qualcomm snapdragon |
|
| Vendors & Products |
Qualcomm
Qualcomm snapdragon |
Wed, 24 Sep 2025 18:15:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Metrics |
ssvc
|
Wed, 24 Sep 2025 15:45:00 +0000
| Type | Values Removed | Values Added |
|---|---|---|
| Description | Transient DOS while parsing the EPTM test control message to get the test pattern. | |
| Title | Buffer Over-read in BT Controller | |
| Weaknesses | CWE-126 | |
| References |
| |
| Metrics |
cvssV3_1
|
Status: PUBLISHED
Assigner: qualcomm
Published: 2025-09-24T15:33:51.163Z
Updated: 2025-09-24T17:28:16.793Z
Reserved: 2025-05-06T08:33:16.260Z
Link: CVE-2025-47318
Updated: 2025-09-24T17:28:14.030Z
Status : Awaiting Analysis
Published: 2025-09-24T16:15:37.100
Modified: 2025-09-24T18:11:24.520
Link: CVE-2025-47318
No data.